Characterization and Reduction of Capacitive Loss Induced by Sub-Micron Josephson Junction Fabrication in Superconducting Qubits
نویسندگان
چکیده
Josephson Junction Fabrication in Superconducting Qubits A. Dunsworth, a) A. Megrant, a) C. Quintana, Zijun Chen, R. Barends, B. Burkett, B. Foxen, Yu Chen, B. Chiaro, A. Fowler, R. Graff, E. Jeffrey, J. Kelly, E. Lucero, J.Y. Mutus, M. Neeley, C. Neill, P. Roushan, D. Sank, A. Vainsencher, J. Wenner, T.C. White, and John M. Martinis 2, b) Department of Physics, University of California, Santa Barbara, CA 93106-9530 Google, Santa Barbara, CA 93117
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